Characterization of the Electrical Properties and Thickness of Thin Epitaxial Semiconductor Layers by THz Reflection Spectroscopy

Journal of Applied Physics- United States

doi 10.1063/1.1412574

Full Text

Abstract

Available in

Date

Authors

Publisher

AIP Publishing

Related search

Characterization of Epitaxial Semiconductor Layers Using Terahertz Time-Domain Spectroscopy

Bunseki Kagaku
Analytical Chemistry
2003English

Electrical Characterization of Conducting Polypyrrole by THz Time-Domain Spectroscopy

Applied Physics Letters
AstronomyPhysics
2000English

Epitaxial Growth and Electrical Transport Properties of Cr2GeC Thin Films

Physical Review B
2011English

Influence of the Electrical Conductivity on Magnetic Properties of CdZnMnTe Epitaxial Layers

2010English

Preparation and Electrical Properties of Vapor Grown InP and In1-xGaxP Epitaxial Layers

IEEJ Transactions on Fundamentals and Materials
Electronic EngineeringElectrical
1974English

Accuracy and Resolution of THz Reflection Spectroscopy for Medical Imaging

Physics in Medicine and Biology
RadiologicalRadiologyNuclear MedicineUltrasound TechnologyImaging
2010English

Growth and Characterization of Epitaxial Piezoelectric and Semiconductor Films.

1980English

The Electrical, Optical, and Structural Properties of GaN Epitaxial Layers Grown on Si(111) Substrate With Interlayers

Superlattices and Microstructures
Electronic EngineeringElectricalCondensed Matter PhysicsMaterials Science
2009English

Optimization and Characterization of NiO Thin Film and the Influence of Thickness on the Electrical Properties of N-ZnO Nanorods/P-NiO Heterojunction

Semiconductor Science and Technology
Electronic EngineeringCondensed Matter PhysicsOpticalMaterials ChemistryElectricalMagnetic MaterialsElectronic
2014English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2026 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy