Amanote Research

Amanote Research

    RegisterSign In

Features of the ISO-25498: Method of Selected Area Electron Diffraction Analysis in Transmission Electron Microscopy

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927613012671
Full Text
Open PDF
Abstract

Available in full text

Categories
Instrumentation
Date

August 1, 2013

Authors
Delu Liu
Publisher

Cambridge University Press (CUP)


Related search

How to Resolveab-Initionanostructures by Electron Diffraction: Applications of Beam Precession in Transmission Electron Microscopy

Acta Crystallographica Section A Foundations of Crystallography
2006English

Transmission Electron Microscopy

Springer Series in Optical Sciences
OpticalElectronicMagnetic Materials
2008English

Charge Density Mapping via Scanning Diffraction in Scanning Transmission Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2019English

Analysis of Nanostructures With Scanning Transmission Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2003English

Analytical Transmission Electron Microscopy

Reviews in Mineralogy and Geochemistry
PetrologyGeochemistry
2014English

Recent Progress in Materials Analysis by Transmission Electron Microscopy

Materials Transactions, JIM
1995English

Crystal Structure Analysis Using Scanning Transmission Electron Microscopy

Nihon Kessho Gakkaishi
2019English

High-Resolution Transmission Electron Microscopy.

Hyomen Kagaku
1989English

Reducing Electron Beam Damage With Multipass Transmission Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2017English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy