Low Energy, Low Angle, Large Area Ion Polishing for Improved EBSD Indexing

Microscopy Today
doi 10.1017/s1551929500050082
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Low Energy, Low Angle, Large Area Ion Polishing for Improved EBSD Indexing

Microscopy and Microanalysis
Instrumentation
2009English

High Resolution Low kV EBSD of Heavily Deformed and Nanocrystalline Aluminium by Dictionary-Based Indexing

Scientific Reports
Multidisciplinary
2018English

Kaufman-Type Low-Energy Ion Source.

SHINKU
1990English

Low Damage Sample Preparation of Semiconductor Materials Using Low Energy Ion Milling

Microscopy and Microanalysis
Instrumentation
2003English

Velocity Scaling of Ion Neutralization in Low Energy Ion Scattering

Physical Review Letters
AstronomyPhysics
2002English

FLAIR, a Facility for Low-Energy Antiproton and Ion Research

2009English

Low-Energy Broad Area Electron Beam for Etching Microelectronic Materials

Vacuum
SurfacesInstrumentationCoatingsCondensed Matter PhysicsFilms
1989English

Low-Energy, High-Resolution, Variable Angle Electron Impact Spectroscopy.

1969English

Ultra-Low Loss Large Area Waveguide Coils for Integrated Optical Gyroscopes

IEEE Photonics Technology Letters
Electronic EngineeringOpticsMolecular Physics,OpticalElectricalAtomicMagnetic MaterialsElectronic
2017English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy