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How to Set Up Your STEM for EELS at Very High Energy Losses

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927617006067
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Abstract

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Categories
Instrumentation
Date

July 1, 2017

Authors
Ian MacLarenAlan J. CravenColin BlackSam McFadzeanHidetaka Sawada
Publisher

Cambridge University Press (CUP)


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