Cross Sectional Processing of Ferroelectric Thin Films by Ion-Milling for AFM Analysis

Materia Japan
doi 10.2320/materia.57.602
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Japan Institute of Metals

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy