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No Compromise in Correlative Microscopy: One Sample, One Preparation Protocol for CLSM and TEM

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927603445996
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Abstract

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Categories
Instrumentation
Date

July 16, 2003

Authors
S.S. BielK. KawaschinskiK.P. WitternU. HintzeR. Wepf
Publisher

Cambridge University Press (CUP)


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