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High-Resolution Compton Scattering as a New Tool for Imaging Dopants and Probing Metal–insulator Transitions
Acta Crystallographica Section A Foundations of Crystallography
doi 10.1107/s0108767311097200
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Date
August 22, 2011
Authors
A. Bansil
Publisher
International Union of Crystallography (IUCr)
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