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Advantages of Broad Ion Beam (BIB) Processing Compared With Focused Ion Beam (FIB) Technology for 3D Investigation of Heterogeneous Solids
Microscopy and Microanalysis
- United Kingdom
doi 10.1017/s1431927603016106
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Categories
Instrumentation
Date
September 1, 2003
Authors
W. Hauffe
S. Menzel
T. Göbel
Publisher
Cambridge University Press (CUP)