Evaluation of Low-Fusing Ceramic Systems Combined With Titanium Grades II and v by Bending Test and Scanning Electron Microscopy

Journal of Applied Oral Science - Brazil
doi 10.1590/s1678-77572003000400015
Full Text
Abstract

Available in full text

Date
Authors
Publisher

FapUNIFESP (SciELO)

Related search

Ultra-Low Voltage Scanning Electron Microscopy

Microscopy Today
1996English

Physics of Low Voltage Scanning Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2002English

Scanning Electron Microscopy (SEM) Analysis and Hardness of Diffusion Bonded Titanium-Titanium and Titanium-Copper Plates With Static Force and Without Interlayers

Open Journal of Composite Materials
2017English

Scanning Electron Microscopy

2013English

Enamel Evaluation by Scanning Electron Microscopy After Debonding Brackets and Removal of Adhesive Remnants

Journal of Clinical and Experimental Dentistry
Dentistry
2018English

Scanning Electron Microscopy

2012English

Scanning Electron Microscopy

2019English

Low Temperature Scanning Electron Microscopy of Irregular Snow Crystals

Microscopy and Microanalysis
Instrumentation
2002English

Scanning Electron Microscopy With Slow Electrons

Microscopy and Microanalysis
Instrumentation
2013English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy