Thin Film Thickness and Grain Structure Determination of Ferroelectric SrBi2Ta2O9 With Cross-Sectional Atomic Force Microscopy

Microscopy and Microanalysis- United Kingdom

doi 10.1017/s1431927602106672

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Instrumentation

Date

August 1, 2002

Authors

C. Caragianis-Broadbridge

Publisher

Cambridge University Press (CUP)

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