Synchrotron Based Measurements of the Soft X-Rayperformance of Thin Film Multilayer Structures

doi 10.1117/12.949670
Full Text
Abstract

Available in full text

Date
Authors
Publisher

SPIE

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy