Translation of Automotive Module RF Immunity Test Limits Into Equivalent IC Test Limits Using S-Parameter IC Models

doi 10.1109/emccompo.2013.6735209
Full Text
Abstract

Available in full text

Date
Authors
Publisher

IEEE

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy