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Impact of Strain on S/D Tunneling in FinFETs: A MS-EMC Study
doi 10.1109/sispad.2018.8551707
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Date
September 1, 2018
Authors
Cristina Medina-Bailon
Carlos Sampedro
Jose Luis Padilla
Andres Godoy
Luca Donetti
Vihar P. Georgiev
Francisco Gamiz
Asen Asenov
Publisher
IEEE
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