The Ultimate Resolution in Aberration-Corrected STEM

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927602101516
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Atomic-Resolution EELS in Aberration-Corrected STEM

Microscopy and Microanalysis
Instrumentation
2003English

High Resolution Studies of Oxide Multiferroic Interfaces in the Aberration-Corrected STEM

Microscopy and Microanalysis
Instrumentation
2017English

Aberration-Corrected STEM for Elemental Mapping

Microscopy and Microanalysis
Instrumentation
2003English

Surface Channeling in Aberration-Corrected STEM of Nanostructures

Microscopy and Microanalysis
Instrumentation
2010English

Understanding Catalyst Stability Through Aberration-Corrected STEM

Microscopy and Microanalysis
Instrumentation
2009English

Atomic Resolution Characterization of Pt Based Bi-Metallic Nano-Catalysts Using Aberration Corrected STEM

Microscopy and Microanalysis
Instrumentation
2014English

Nanomilling for Aberration – Corrected TEM and HAADF STEM

Microscopy and Microanalysis
Instrumentation
2009English

Ultra-High Vacuum Aberration-Corrected STEM for In-Situ Studies

Microscopy and Microanalysis
Instrumentation
2016English

Aberration-Corrected HAADF-STEM Studies of Nano-Gold/Titania Catalysts

Microscopy and Microanalysis
Instrumentation
2010English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy