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Device-Aware Test: A New Test Approach Towards DPPB Level

doi 10.1109/itc44170.2019.9000134
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Abstract

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Date

November 1, 2019

Authors
Moritz FiebackLizhou WuGuilherme Cardoso MedeirosHassen AzizaSiddharth RaoErik Jan MarinissenMottaqiallah TaouilSaid Hamdioui
Publisher

IEEE


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