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Device-Aware Test: A New Test Approach Towards DPPB Level
doi 10.1109/itc44170.2019.9000134
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Date
November 1, 2019
Authors
Moritz Fieback
Lizhou Wu
Guilherme Cardoso Medeiros
Hassen Aziza
Siddharth Rao
Erik Jan Marinissen
Mottaqiallah Taouil
Said Hamdioui
Publisher
IEEE
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