A Statistical Approach to Correct X-Ray Response Non-Uniformity in Microstrip Detectors for High-Accuracy and High-Resolution Total-Scattering Measurements
Journal of Synchrotron Radiation - United Kingdom
doi 10.1107/s1600577519002145
Full Text
Open PDFAbstract
Available in full text
Date
April 5, 2019
Authors
Publisher
International Union of Crystallography (IUCr)