On the Limits of Scalpel AFM for the 3D Electrical Characterization of Nanomaterials

Advanced Functional Materials - United Kingdom
doi 10.1002/adfm.201802266
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Wiley

Related search

Electrical Characterization of 3D Au Microelectrodes for Use in Retinal Prostheses

Sensors
InstrumentationInformation SystemsElectronic EngineeringBiochemistryAnalytical ChemistryMolecular Physics,ElectricalAtomicMedicineOptics
2015English

Characterization of Nanomaterials

JOM
Materials ScienceEngineering
2013English

Improvement of the Correlative AFM and ToF-SIMS Approach Using an Empirical Sputter Model for 3D Chemical Characterization

English

Ultrafast Mid-Ir Laser Scalpel: Protein Signals of the Fundamental Limits to Minimally Invasive Surgery

PLoS ONE
Multidisciplinary
2010English

Electrical Characterization of Thin Silicon Films Produced by Metal-Induced Crystallization on Insulating Substrates by Conductive AFM

Journal of Surface Analysis
2011English

Electrical Impedance Tomography in 3D: Characterization and Evaluation

English

Synthesis, Characterization, Toxicity of Nanomaterials for Biomedical Applications

2011English

Microsurgical Laser Scalpel Based on Spectroscopic Feedback: The Smart Scalpel

2001English

A 3D Contact Analysis Approach for the Visualization of the Electrical Contact Asperities

AIP Advances
NanotechnologyAstronomyPhysicsNanoscience
2017English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy