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Measurement of Lateral Charge Diffusion in Thick, Fully Depleted, Back-Illuminated CCDs

doi 10.1109/nssmic.2003.1352164
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Abstract

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Date

January 1, 2003

Authors
A. KarcherC.J. BebekW.F. KolbeD. MaurathV. PrasadM. UslenghiM. Wagner
Publisher

IEEE


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