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Impact of Interface Traps on Direct and Alternating Current in Tunneling Field-Effect Transistors
Journal of Electrical and Computer Engineering
- United States
doi 10.1155/2015/630178
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Categories
Electronic Engineering
Signal Processing
Electrical
Computer Science
Date
January 1, 2015
Authors
Zhi Jiang
Yiqi Zhuang
Cong Li
Ping Wang
Yuqi Liu
Publisher
Hindawi Limited
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