Morphology and Spectroscopic Ellipsometry of PMMA Thin Films

Applied Physics Research
doi 10.5539/apr.v9n2p5
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Canadian Center of Science and Education

Related search

In-Situ Spectroscopic Ellipsometry for Studies of Thin Films and Membranes

English

Spectroscopic Ellipsometry. Real-Time Monitoring and Control of Thin-Film Growth Using Spectroscopic Ellipsometry.

Hyomen Kagaku
1997English

Modeling the Transport Properties of Epitaxially Grown Thermoelectric Oxide Thin Films Using Spectroscopic Ellipsometry

Applied Physics Letters
AstronomyPhysics
2012English

Electronic and Structural Properties of Molybdenum Thin Films as Determined by Real-Time Spectroscopic Ellipsometry

Applied Physics Letters
AstronomyPhysics
2009English

Ellipsometry of Unsupported and Embedded Thin Films

Le Journal de Physique Colloques
1983English

Studies on Inx(As2Se3)1-X Thin Films Using Variable Angle Spectroscopic Ellipsometry (VASE)

Materials Science-Poland
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
2015English

Spectroscopic Ellipsometry, Optical, Structural and Electrical Investigation of Sprayed Pure and Sn-Doped ZnO Thin Films

EPJ Web of Conferences
AstronomyPhysics
2013English

Analysis of Controlled Mixed-Phase (Amorphous+microcrystalline) Silicon Thin Films by Real Time Spectroscopic Ellipsometry

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
SurfacesFilmsInterfacesCondensed Matter PhysicsCoatings
2009English

Spectroscopic Ellipsometry Study of Organic-Inorganic Halide: FAPbIxBr3−x Perovskite Thin Films by Two-Step Method

2017English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy