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Determining the Thickness of Atomically Thin MoS2 and WS2 in the TEM

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s143192761401071x
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Abstract

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Categories
Instrumentation
Date

August 1, 2014

Authors
Ryan J. WuMichael L. OdlyzkoK. Andre Mkhoyan
Publisher

Cambridge University Press (CUP)


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