Combined Use of XAFS, XRD and TEM to Unravel the Microstructural Evolution of Nanostructured ZrO2–SiO2 Binary Oxides: From Nanometres Down to the Molecular Domain
CrystEngComm - United Kingdom
doi 10.1039/b911004f
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Date
January 1, 2010
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Royal Society of Chemistry (RSC)