Quantitative EDX and EELS Elemental Mapping at Atomic Resolution

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927614004577
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Towards Spectral Imaging and Elemental Mapping at Atomic Resolution

Microscopy and Microanalysis
Instrumentation
2003English

Advances in Atomic-Resolution and Molecular-Detection EELS

Microscopy and Microanalysis
Instrumentation
2017English

Atomic-Resolution EELS in Aberration-Corrected STEM

Microscopy and Microanalysis
Instrumentation
2003English

Elemental Mapping of Co-Pr Nanostructured Powders by EELS Image Filtering

Microscopy and Microanalysis
Instrumentation
2002English

Atomic Resolution Z-Contrast Imaging and EELS: Application for Ge/SiO2 Interface

Microscopy and Microanalysis
Instrumentation
2003English

Parallel EELS Elemental Mapping in Scanning Transmission Electron Microscopy: Use of the Difference Methods

Microscopy Microanalysis Microstructures
1991English

Nanometer Resolution Elemental Mapping in Graphene-Based TEM Liquid Cells

English

Nanometer Resolution Elemental Mapping in Graphene-Based TEM Liquid Cells

English

Nanometer Resolution Elemental Mapping in Graphene-Based TEM Liquid Cells

English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy