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High Resolution Characterization on Point Defects in (Pr,Al) Implanted SrTiO3
Microscopy and Microanalysis
- United Kingdom
doi 10.1017/s1431927611009032
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Categories
Instrumentation
Date
July 1, 2011
Authors
G Zhu
A Knights
G Botton
Publisher
Cambridge University Press (CUP)
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