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A Function Space Approach to Sampled Data Control Systems and Tracking Problems

IEEE Transactions on Automatic Control - United States
doi 10.1109/9.286247
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Abstract

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Categories
ControlSystems EngineeringComputer Science ApplicationsElectricalElectronic Engineering
Date

April 1, 1994

Authors
Y. Yamamoto
Publisher

Institute of Electrical and Electronics Engineers (IEEE)


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