Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope - Part 2

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927616003895
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Thin Film and Multilayer Scintillators for Low Voltage Backscattered Electron Imaging in the Scanning Electron Microscope

Microscopy and Microanalysis
Instrumentation
2015English

Imaging of Shallow Surface Topography by the Low-Loss Electron (LLE) Method in the Scanning Electron Microscope

Microscopy Today
2002English

Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope

Microscopy and Microanalysis
Instrumentation
2018English

Cell Surface and Cell Outline Imaging in Plant Tissues Using the Backscattered Electron Detector in a Variable Pressure Scanning Electron Microscope

Plant Methods
BiotechnologyPlant ScienceGenetics
2013English

Atomic-Resolution Electron Energy-Loss Spectroscopy in the Scanning Transmission Electron Microscope

Journal of Microscopy
Forensic MedicinePathologyHistology
1995English

Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

Advances in OptoElectronics
Electronic EngineeringOpticalElectricalMagnetic MaterialsElectronic
2011English

Scanning Electron Microscope

Micron (1969)
1982English

Scanning Electron Microscope

English

Scanning Electron Microscope

English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy