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Are the Pressures Measured by Hig-Pressure X-Ray Diffraction Really Reliable?

Review of High Pressure Science and Technology/Koatsuryoku No Kagaku To Gijutsu - Japan
doi 10.4131/jshpreview.13.66
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Abstract

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Categories
Materials ScienceChemistryCondensed Matter Physics
Date

January 1, 2003

Authors
Takehiko YAGI
Publisher

The Japan Society of High Pressure Science and Technology


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