Resonant Rutherford Backscattering Studies of Cerium Oxide Thin Films Deposited by RF Sputtering
IEEE Transactions on Applied Superconductivity - United States
doi 10.1109/77.620833
Full Text
Open PDFAbstract
Available in full text
Categories
Date
June 1, 1997
Authors
Publisher
Institute of Electrical and Electronics Engineers (IEEE)