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Logic Synthesis for Reliability: An Early Start to Controlling Electromigration and Hot-Carrier Effects
IEEE Transactions on Reliability
- United States
doi 10.1109/24.387379
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Abstract
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Categories
Electronic Engineering
Risk
Reliability
Electrical
Safety
Quality
Date
June 1, 1995
Authors
K. Roy
S. Prasad
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
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