Artifacts From Manganese Reduction in Rock Samples Prepared by Focused Ion Beam (FIB) Slicing for X-Ray Microspectroscopic Analysis

doi 10.5194/gi-2018-20-ac2
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Copernicus GmbH

Related search

Artifacts From Manganese Reduction in Rock Samples Prepared by Focused Ion Beam (FIB) Slicing for X-Ray Microspectroscopic Analysis

2019English

X-Ray Diffraction Using Focused-Ion-Beam-Prepared Single Crystals

Journal of Applied Crystallography
BiochemistryGeneticsMolecular Biology
2020English

Focused Ion Beam (FIB) Microscopy and Technology

Microscopy and Microanalysis
Instrumentation
2002English

Identification of Cleavage Origins Using Focused Ion Beam (FIB) Sectioning

Microscopy and Microanalysis
Instrumentation
2002English

Superconductivity in the System MoxCyGazOδ Prepared by Focused Ion Beam Induced Deposition

Journal of Applied Physics
AstronomyPhysics
2014English

Investigation of Slice Thickness for FIB Tomography in a Plasma Focused Ion Beam System

Microscopy and Microanalysis
Instrumentation
2018English

Monolithic Focused Reference Beam X-Ray Holography

Nature Communications
AstronomyGeneticsMolecular BiologyBiochemistryChemistryPhysics
2014English

Advantages of Broad Ion Beam (BIB) Processing Compared With Focused Ion Beam (FIB) Technology for 3D Investigation of Heterogeneous Solids

Microscopy and Microanalysis
Instrumentation
2003English

Focused Ion Beam Preparation Techniques for EFTEM Analysis

Microscopy and Microanalysis
Instrumentation
2003English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy