Strength Reliability of Micro Polycrystalline Silicon Structure

Key Engineering Materials - Switzerland
doi 10.4028/0-87849-440-5.777
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Trans Tech Publications Ltd.

Related search

Reliability Analysis of Ultra Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
EngineeringAstronomyPhysics
2007English

Fracture Behavior of Granular Polycrystalline Silicon Using Micro-Scale and Macro-Scale Indentation Techniques

Metallurgical and Materials Transactions E
2013English

Strength of Silicon.

Materia Japan
1998English

Polycrystalline Silicon ISFETs on Glass Substrate

Sensors
InstrumentationInformation SystemsElectronic EngineeringBiochemistryAnalytical ChemistryMolecular Physics,ElectricalAtomicMedicineOptics
2005English

Polycrystalline Silicon Piezoresistive Nano Thin Film Technology

2010English

Laser Annealing of Thin Film Polycrystalline Silicon Solar Cell

EPJ Photovoltaics
Electronic EngineeringCondensed Matter PhysicsRenewable EnergySustainabilityOpticalElectricalMagnetic MaterialsElectronicthe Environment
2013English

Efficiency Enhancement of Nanoporous Silicon/Polycrystalline-Silicon Solar Cells by Application of Trenched Electrodes

International Journal of Photoenergy
Materials ScienceRenewable EnergyMolecular Physics,SustainabilityAtomicChemistryOpticsthe Environment
2014English

Cross-Plane Phonon Conduction in Polycrystalline Silicon Films

Journal of Heat Transfer
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
2015English

Control of Grain-Boundary Tunneling Barriers in Polycrystalline Silicon

Applied Physics Letters
AstronomyPhysics
2002English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy