Characterization of Nanoscale Structures Using a Combination of an Ultra-High Resolution Field Emission SEM and Large Area Silicon Drift Detector.

Microscopy and Microanalysis- United Kingdom

doi 10.1017/s1431927609094264

Full Text

Abstract

Available in

Categories

Instrumentation

Date

July 1, 2009

Authors

Publisher

Cambridge University Press (CUP)

Related search

Workshop on High-Resolution Immunocytochemistry of Cell Surfaces Using Field Emission SEM.

Journal of Histochemistry and Cytochemistry

English

Study of a High-Resolution PET System Using a Silicon Detector Probe

Physics in Medicine and Biology

Nuclear Medicine

Ultrasound Technology

English

A New Role of a Low-Voltage, Ultra-High Resolution FE-SEM for Corrosion Studies (1)-Sample Surface Preparation for Ultra-High Resolution FE-SEM-

Zairyo to Kankyo/ Corrosion Engineering

Materials Chemistry

Electrochemistry

English

Development of a New Silicon Drift Detector Module

AIP Conference Proceedings

English

The Versatile FEG-SEM: From Ultra-High Resolution to Ultra-High Surface Sensitivity

Microscopy and Microanalysis

Instrumentation

English

Ultra-High Spatial Resolution Multi-Energy CT Using Photon Counting Detector Technology

English

Characterization of Polymers and Catalysts Using Scanning Transmission Electron Microscopy (STEM) in a Field Emission SEM

Microscopy and Microanalysis

Instrumentation

English

The ALICE Silicon Drift Detector System

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

High Energy Physics

Instrumentation

English

Performance Characterization of a New High Resolution PET Scintillation Detector

Physics in Medicine and Biology

Nuclear Medicine

Ultrasound Technology

English