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STEM Aberration Correction: Where Next?

Microscopy and Microanalysis- United Kingdom

doi 10.1017/s143192760210153x

Full Text

Abstract

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Categories

Instrumentation

Date

August 1, 2002

Authors

O.L. KrivanekN. DellbyM. MurfittP.D. NellistZ. Szilagyi

Publisher

Cambridge University Press (CUP)


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