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Discriminating Among the Log-Normal, Weibull, and Generalized Exponential Distributions
IEEE Transactions on Reliability
- United States
doi 10.1109/tr.2009.2019494
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Categories
Electronic Engineering
Risk
Reliability
Electrical
Safety
Quality
Date
September 1, 2009
Authors
A.K. Dey
D. Kundu
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
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