Amanote Research
Register
Sign In
Scanning He+ Ion Beam Microscopy and Metrology
doi 10.1063/1.3657869
Full Text
Open PDF
Abstract
Available in
full text
Date
January 1, 2011
Authors
David C. Joy
David G. Seiler
Alain C. Diebold
Robert McDonald
Amal Chabli
Erik M. Secula
Publisher
AIP
Related search
Three-Dimensional Cathodoluminescence by Focused Ion Beam - Scanning Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Submicrometer Microelectronics Dimensional Metrology: Scanning Electron Microscopy
Journal of Research of the National Bureau of Standards
Multiple-Beam Scanning Electron Microscopy
Microscopy Today
Scanning Transmission Ion Microscopy and Diffraction Imaging
Microscopy and Microanalysis
Instrumentation
Differential-Concentration Scanning Ion Conductance Microscopy
Analytical Chemistry
Analytical Chemistry
Superior Imaging Quality of Scanning Helium-Ion Microscopy: A Look at Beam-Sample Interactions,
Microscopy and Microanalysis
Instrumentation
Focused Ion Beam (FIB) Microscopy and Technology
Microscopy and Microanalysis
Instrumentation
Material Sensitive Scanning Probe Microscopy of Subsurface Semiconductor Nanostructures via Beam Exit Ar Ion Polishing
Nanotechnology
Mechanics of Materials
Electronic Engineering
Mechanical Engineering
Materials Science
Nanoscience
Electrical
Bioengineering
Nanotechnology
Chemistry
3D Imaging of the Early Embryonic Chicken Heart With Focused Ion Beam Scanning Electron Microscopy
Microscopy and Microanalysis
Instrumentation
