SOC Test-Architecture Optimization for the Testing of Embedded Cores and Signal-Integrity Faults on Core-External Interconnects

ACM Transactions on Design Automation of Electronic Systems- United States

doi 10.1145/1455229.1455233

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Abstract

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Categories

Computer Science Applications

Electronic Engineering

Computer Graphics

Computer-Aided Design

Date

January 1, 2009

Authors

Krishnendu Chakrabarty

Publisher

Association for Computing Machinery (ACM)

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