Application of Piezoelectric Stress Gauges to the Measurement of Fast-Rise-Time Multimegampere Electric Currents

AIP Conference Proceedings - United States
doi 10.1063/1.46478
Full Text
Abstract

Available in full text

Date
Authors
Publisher

AIP

Related search

Calculation of Electric Potential Rise of Horizontal Grounding Electrode Caused by Lightning Stroke Currents

Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
2013English

Effects of a Quantum Measurement on the Electric Conductivity: Application to Graphene

Physical Review B
2010English

Application of Fourier Analysis to the X-Ray Stress Measurement

Zairyo/Journal of the Society of Materials Science, Japan
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
1965English

Fast Neutral Pressure Gauges in NSTX

Review of Scientific Instruments
MedicineInstrumentation
2004English

Application of Semiconductor Strain-Gauges to Measuring Intercuspal Position

Nihon Hotetsu Shika Gakkai Zasshi
1974English

Application of CCD Image Sensor to Measurement of Fast Changing Bubble Diameter

Transactions of the Society of Instrument and Control Engineers
1989English

Bending Stress Analysis of a Piezoelectric Nanoplate With Flexoelectricity Under Inhomogeneous Electric Fields

AIP Advances
NanotechnologyAstronomyPhysicsNanoscience
2019English

Research on Fast Rise Time EMP Radiating-Wave Simulator

Journal of Physics: Conference Series
AstronomyPhysics
2013English

Fast Model Predictive Control and Its Application to Energy Management of Hybrid Electric Vehicles

2011English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy