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Charge-Coupled Devices Combined With Centroid Algorithm for Laser Beam Deviation Measurements Compared to a Position-Sensitive Device
Optical Engineering
- United States
doi 10.1117/1.3554379
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Categories
Engineering
Optics
Atomic
Molecular Physics,
Date
March 1, 2011
Authors
Bo Hou
Publisher
SPIE-Intl Soc Optical Eng
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