Amanote Research

Amanote Research

    RegisterSign In

Industrial Application of Surface and Interface Analysis. Don't Make a White Elephant Out of Your XPS.

Bulletin of the Japan Institute of Metals
doi 10.2320/materia1962.30.581
Full Text
Open PDF
Abstract

Available in full text

Date

January 1, 1991

Authors
Akihiro Tanaka
Publisher

Japan Institute of Metals


Related search

Compositional Analysis of Surface and Interface. Depth Profiling Analysis and XPS.

Nihon Kessho Gakkaishi
1987English

Industrial Application of Surface and Interface Analysis. The Reliability of the Quantitative Analysis With AES.

Bulletin of the Japan Institute of Metals
1991English

Examination of the Interface of a Model Adhesive Joint by Surface Analysis: A Study by XPS and ToF-SIMS

Surface and Interface Analysis
SurfacesCondensed Matter PhysicsInterfacesMaterials ChemistryFilmsCoatingsChemistry
2009English

Honey Buzzards Don't Always Make a Beeline

Journal of Animal Ecology
EvolutionEcologySystematicsAnimal ScienceBehaviorZoology
2017English

Don't Keep Your Distance

Nature
Multidisciplinary
2005English

Surface and Interface Analysis

2016English

“Come Out of Your Country and Your Kinsfolk”

2011English

Imaging XPS for Industrial Applications

Journal of Electron Spectroscopy and Related Phenomena
Condensed Matter PhysicsOpticsRadiationMolecular Physics,SpectroscopyTheoretical ChemistryOpticalAtomicMagnetic MaterialsElectronicPhysical
2019English

Don't Feed Your Movements When You Shift Your Objects*

2012English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy