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Ablation of NIF Targets and Diagnostic Components by High-Power Lasers and X Rays From High-Temperature Plasmas

Proceedings of SPIE - The International Society for Optical Engineering - United States
doi 10.1117/12.407322
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Abstract

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Categories
Electronic EngineeringCondensed Matter PhysicsOpticalApplied MathematicsComputer Science ApplicationsElectricalMagnetic MaterialsElectronic
Date

January 1, 2000

Authors
David C. Eder
Publisher

SPIE


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