Electrostatic Force Microscopy Analysis of Bi0.7Dy0.3FeO3 Thin Films Prepared by Pulsed Laser Deposition Integrated With ZnO Films for Microelectromechanical Systems and Memory Applications
Modern Electronic Materials
doi 10.3897/j.moem.4.2.33306
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Date
June 1, 2018
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Pensoft Publishers