Amanote Research

Amanote Research

    RegisterSign In

Spatial Convolution of a Stress Field Analyzed by X-Ray Diffraction

Advanced Materials Research
doi 10.4028/www.scientific.net/amr.996.169
Full Text
Open PDF
Abstract

Available in full text

Date

August 1, 2014

Authors
Charlie KahlounR. BadjiS. QueyreauP. FranciosiBrigitte Bacroix
Publisher

Trans Tech Publications, Ltd.


Related search

Quantitative Analysis by X-Ray Diffraction

Clay Minerals
PetrologyGeochemistry
1962English

X-Ray Powder Diffraction of Mineralogical Samples by X-Ray Goebel Mirrors

Bulletin of the Geological Society of Greece
2001English

X-Ray Metrology by Diffraction and Reflectivity

AIP Conference Proceedings
AstronomyPhysics
2001English

X-Ray Diffraction by Surface Acoustic Waves

Le Journal de Physique IV
1994English

X-Ray Surface Diffraction.

Bulletin of the Japan Institute of Metals
1989English

X-Ray Diffraction Topography

English

X-Ray Diffraction Study of Chemical Bonds Under External Electric Field

Acta Crystallographica Section A Foundations of Crystallography
2006English

X-Ray Diffraction Topography

English

Submicron X-Ray Diffraction

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
High Energy PhysicsInstrumentationNuclear
2001English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy