Retraction: “Nucleation-Controlled Low-Temperature Solid-Phase Crystallization for Sn-Doped Polycrystalline-Ge Film on Insulator With High Carrier Mobility (∼550 Cm2/v S)” [Appl. Phys. Lett. 112, 242103 (2018)]

Applied Physics Letters - United States
doi 10.1063/1.5046407
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