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Correction of Thickness Artifacts in EFTEM Elemental Mapping of BiologicalSpecimens

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927606067055
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Abstract

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Categories
Instrumentation
Date

July 31, 2006

Authors
M AronovaG ZhangR Leapman
Publisher

Cambridge University Press (CUP)


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