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Report From the NIST-MAS-AMAS Roadmap Workshop on Variable Pressure Scanning Electron Microscopy/Environmental Scanning Electron Microscopy
Microscopy and Microanalysis
- United Kingdom
doi 10.1017/s1431927606063215
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Abstract
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Categories
Instrumentation
Date
July 31, 2006
Authors
S Wight
D Newbury
B Griffin
Publisher
Cambridge University Press (CUP)