Deep-Level Transient Spectroscopy Measurements of Majority Carrier Traps in Neutron Irradiated N-Type Silicon Detectors
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Netherlands
doi 10.1016/0168-9002(89)91093-0
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Date
July 1, 1989
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Elsevier BV