Amanote Research
Register
Sign In
Thermal Stress Analysis of Electronic Packaging
doi 10.22215/etd/2004-05968
Full Text
Open PDF
Abstract
Available in
full text
Date
Unknown
Authors
Victor Aldea
Publisher
Carleton University
Related search
Electronic Characteristics Changes of Semiconductor Devices Caused by Packaging Stress.
Transactions of the Japan Society of Mechanical Engineers Series A
Thermal Analysis of Compact Electronic Equipments. 1st Report. Thermal Analysis of Notebook PC.
Nihon Kikai Gakkai Ronbunshu, B Hen/Transactions of the Japan Society of Mechanical Engineers, Part B
Condensed Matter Physics
Mechanical Engineering
Thermal Stress Analysis by Mesh Superposition Method(1st Report, Formulation of Mesh Superposition Method for Thermal Stress Analysis)
Transactions of the Japan Society of Mechanical Engineers Series A
Progress of Packaging Technologies for Superconducting Electronic Devices
TEION KOGAKU (Journal of Cryogenics and Superconductivity Society of Japan)
Experimental Analysis of Thermal Stress Using Alternative Polariscope
International Journal for Research in Applied Science and Engineering Technology
Application of Optical Methods to Electronic Component Stress Analysis
Thermal Stress Analysis of a Continuous Rigid Frame Bridge
Annals of Civil and Environmental Engineering
Two-Dimensional Thermal Stress Analysis Using X-Fem
Transactions of the Japan Society of Mechanical Engineers Series A
Thermal Stress Analysis in Ultra-Thin Whitetopping Pavement