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A Single Built-In Sensor to Check Pull-Up and Pull-Down CMOS Networks Against Transient Faults

doi 10.1109/patmos.2013.6662169
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Abstract

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Date

September 1, 2013

Authors
R. Possamai BastosF. Sill TorresJ.-M. DutertreM.-L. FlottesG. Di NataleB. Rouzeyre
Publisher

IEEE


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