Amanote Research
Register
Sign In
Hot-Carrier Induced Degradation in Surface pMOSFETs.
doi 10.22215/etd/1994-02634
Full Text
Open PDF
Abstract
Available in
full text
Date
Unknown
Authors
Marinette Besson
Publisher
Carleton University
Related search
Hot Carrier Induced Degradation and Gamma Radiation Induced Degradation in SiGe HBTs and VCOs
Hot-Carrier-Induced Degradation in P-Type High-Voltage DEMOS Transistors
Oxygen-Adsorption-Induced Anomalous Capacitance Degradation in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film-Transistors Under Hot-Carrier Stress
Journal of the Electrochemical Society
Surfaces
Condensed Matter Physics
Optical
Electrochemistry
Sustainability
Materials Chemistry
Magnetic Materials
Renewable Energy
Films
Coatings
Electronic
the Environment
Plasmon-Induced Hot-Carrier Generation Differences in Gold and Silver Nanoclusters
Nanoscale
Materials Science
Nanotechnology
Nanoscience
Hot Carrier Chemistry
ChemNanoMat
Energy Engineering
Renewable Energy
Sustainability
Materials Chemistry
Biomaterials
Power Technology
the Environment
Plasmon-Induced Direct Hot-Carrier Transfer at Metal–Acceptor Interfaces
ACS Nano
Materials Science
Nanoscience
Engineering
Nanotechnology
Astronomy
Physics
Effective Density-Of-States Distribution of Polycrystalline Silicon Thin-Film Transistors Under Hot-Carrier Degradation
Journal of Applied Physics
Astronomy
Physics
A New Prediction Method for Hot Carrier Degradation of Submicron PMOSFET With Charge Pumping Technique
Hot-Carrier Infrared Laser Detectors
The Review of Laser Engineering
