Hot-Carrier Induced Degradation in Surface pMOSFETs.

doi 10.22215/etd/1994-02634
Full Text
Abstract

Available in full text

Date

Unknown

Authors
Publisher

Carleton University

Amanote Research

Note-taking for researchers

Follow Amanote

© 2026 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy