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Response of a 0.25 Μm Thin-Film Silicon-On-Sapphire CMOS Technology to Total Ionizing Dose
Journal of Instrumentation
- United Kingdom
doi 10.1088/1748-0221/5/11/c11021
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Categories
Instrumentation
Mathematical Physics
Date
November 29, 2010
Authors
M P King
D Gong
C Liu
T Liu
A C Xiang
J Ye
R D Schrimpf
R A Reed
M L Alles
D M Fleetwood
Publisher
IOP Publishing